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Quartz XOne
- Spectrum Analysis
- Mapping & Linescans
- Hitachi S-2600/XOne Integration
- Silicon Drift Detectors
Integrated X-Ray Microanalysis System for the Hitachi S-2600
The S-2600 XOne system unites the Hitachi S-2600 SEM with the Quartz XOne x-ray microanalysis system into an integrated, affordable, easy-to-use package.
The x-ray microanalysis system is built right in to the microscope. Start a spot or area scan and spectrum acquisition will be started immediately. Flip easily back and forth between imaging and x-ray analysis through the instrument’s unique tab-based user interface. Microscope settings, such as accelerating voltage, are automatically read by the analysis software without requiring user input.
In keeping with the S-2600’s space-saving design, the integrated system uses one monitor, mouse and keyboard for both the SEM and microanalysis functions. There's no need to divert your attention from one monitor to another.
Small size doesn’t mean small feature list, though. In addition to a state-of-the-art SEM, you get a full-featured x-ray analysis system including advanced digital pulse processing and mapping with full spectral imaging.
Plus, because the XOne system was developed by Quartz Imaging, it includes all of the Quartz PCI database functions to track your images and x-ray data and communicate your results to your colleagues.
Good things, it seems, really do come in small packages.
